Skip to content
Semiconductor.co.uk

Company profile

TeraView

Cambridge manufacturer of terahertz spectroscopy and imaging instruments used for non-destructive inspection and characterisation of semiconductor devices, wafers and coatings; spun out of a Toshiba research laboratory.

Company overview

Based in Cambridge, TeraView designs and manufactures terahertz (THz) imaging and spectroscopy instruments. The company was founded in 2001 as a spin-out from Toshiba Corporation and the University of Cambridge, and it maintains close research links with the university's Cavendish Laboratory. Its systems are used for non-destructive inspection, fault analysis, and quality assurance across several industries. Key technologies include Terahertz Pulsed Imaging (TPI) and Electro-Optical Terahertz Pulse Reflectometry (EOTPR), which enable characterisation of materials, detection of defects, and measurement of multi-layer thickness and density. For the semiconductor industry, TeraView provides tools for advanced packaging inspection. Other major application areas include the inspection of coatings for automotive and industrial uses, battery production, and pharmaceutical research and development. The company also offers contract analysis and application support services.

Semiconductor activity

Primary capability: Metrology / Inspection. Supply-chain role: Metrology & Inspection, Test & Measurement, Quality Assurance.

Technologies and capabilities

  • Silicon
  • Advanced Packaging
  • Terahertz Imaging
  • Terahertz Spectroscopy
  • Electro-Optical Terahertz Pulse Reflectometry (EOTPR)
  • Terahertz Pulsed Imaging (TPI)

Terahertz Imaging Systems; Spectroscopy Instruments; Non-Destructive Inspection; Fault Analysis; Contract Analysis; Applications Support

Markets served

  • Semiconductor
  • Automotive
  • Pharmaceutical
  • Battery Production
  • Industrial Coatings
  • Research & Development

UK presence

Cambridge. Part of the Cambridge / East of England cluster.

Research links: University of Cambridge (Cavendish Laboratory).

Sources and verification